Agar Scientific

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  1. CorrStub SEM pin stubs

    CorrStub® SEM specimen stubs for correlative microscopy

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    !NEW!

    CorrStub® is a unique range of SEM pin stubs specifically designed for correlative microscopy and forensic analysis.

  2. NLS vibrating blade tissue micro-slicer

    NLS Vibrating Blade Tissue Micro-Slicer

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    !NEW!

    High performance, vibrating blade tissue micro-slicer.

  3. WELL 6500 Vertical Diamond Wire Saw

    WELL 6500 Precision Vertical Diamond Wire Saw

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    !NEW!

    The proven WELL cutting principles are integrated in the 6500 model, for cutting medium-sized samples up to 300mm in height, 300mm in width.

  4. Vitrobot Tweezers assembly

    Vitrobot Tweezers assembly

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    !NEW!

    Tweezers Assembly for Vitrobot Mark IV, III, II & I.

    Part no: AG47000-500

  5. Vitrobot Filter Paper

    Blotting paper - Vitrobot

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    !NEW!

    Standard Vitrobot Filter Paper.

    Part no: AG47000-100

  6. Cryo-EM Pucks

    Cryo-EM Pucks

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    !NEW!

    Organised storage and transport for Cryo-EM specimen grids under cryogenic conditions.

  7. Cryo-EM Puck Starter Kit

    Cryo-EM Puck Starter Kit

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    !NEW!

    A complete set of pucks and tools for Cryo-EM storage and transport under cryogenic conditions.

    Part no: AGB5001

  8. UltrAuFoil Holey Gold Films

    UltrAuFoil Holey Gold Films

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    !NEW!

    UltrAuFoil® - ultra-stable gold supports for electron cryomicroscopy.

  9. Critical Dimension Magnification Standard

    Pelcotec CDMS 1T Critical Dimension Magnification Standard

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    !NEW!

    NIST traceable with features from 2mm to 1µm for magnification 10-20,000x (ideal for desktop SEM). Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm.

  10. Critical Dimension Magnification Standard

    Pelcotec CDMS 0.1T Critical Dimension Magnification Standard

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    !NEW!

    NIST traceable with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm

  11. Critical Dimension Magnification Standard

    Pelcotec CDMS 1C Critical Dimension Magnification Standard

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    !NEW!

    Individually certified against a NIST standard with features from 2mm to 1µm for a magnification range from 10x - 20,000x; ideal for desk top SEMs and low to medium magnification applications.

  12. CDMS 0.1C Critical Dimension Magnification Standard

    Pelcotec CDMS 0.1C Critical Dimension Magnification Standard

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    !NEW!

    Individually certified against NIST standard with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm.

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Items 1-12 of 109