£ GBP

Agar Scientific

Microscopy and Lab
supplies at your fingertips

Home

FIB

Set Descending Direction

Items 13-24 of 42

  2. 1
  3. 2
  4. 3
  5. 4
  6. of 4 pages
  1. FIB prepared Micro Cross Sectioning and Imaging Service

    FIB prepared Micro-Cross Sectioning and Imaging Service

     More Information

    FIB can precisely locate and section a feature on a sample and directly take images of it.

  2. Thinning coupons

    Thinning coupons

     More Information

    Omniprobe copper TEM sample grid coupons of 45 and 26.5° are available for frontside and backside thinning.

  3. Atom probe preparation coupons

    Atom probe preparation coupons. Box of 20

     More Information

    These copper coupons have been designed to facilitate the preparation of atom probe samples using the Omniprobe's 45° Short-Cut™ tool.

    Part no: AGJ442

  4. TEM grid/sample holders - short post

    TEM grid/sample holders - short post

     More Information
    TEM grid holders with short posts of standard 3.2mm diameter are available.
  5. TEM grid/sample holders - long post

    TEM grid/sample holders - long post, single sample holder

     More Information
    TEM grid holders with short posts of standard 3.2mm diameter are available.

    Part no: AGJ404

  6. TEM grid/sample holders - long post

    TEM grid/sample holders - long post, sample holder base

     More Information
    TEM grid holders with short posts of standard 3.2mm diameter are available.

    Part no: AGJ405

  7. TEM grid/sample holders - long post

    TEM grid/sample holders - long post

     More Information
    TEM grid holders with short posts of standard 3.2mm diameter are available.
  8. TEM grid/sample holders - long post

    TEM grid/sample holders - long post

     More Information
    TEM grid holders with short posts of standard 3.2mm diameter are available.
  9. Fib lift-out grids

    FIB lift-out grids. Pack of 25

     More Information
    These are half-grid lift-out TEM sample holders for FIB applications, made of copper/beryllium.

    Part no: AGJ460

  10. Beryllium half-ring lift-out grids

    Beryllium half-ring lift-out grids. Pack of 10

     More Information
    Simple beryllium half-ring grid offering low etching rates for applications such as tripod polishing, FIB and ion milling.

    Part no: AGJ425

  11. 3 post lift-out grids

    3 post lift-out grids

     More Information

    3 post lift-out grids designed for in situ lift-out.

  12. 4 post lift-out grids

    4 post lift-out grids

     More Information

    4 post lift-out grids designed for in situ lift-out.

Set Descending Direction

Items 13-24 of 42

  2. 1
  3. 2
  4. 3
  5. 4
  6. of 4 pages

FIB

Refine your search

Category
  1. Calibration standards (11)
  2. FIB Sectioning Service (2)
  3. Grid & sample holders (7)
  4. Grids for FIB (5)
  5. Probe tips and holders (3)
  6. Specimen preparation (6)
  7. Specimen storage (2)
  8. Specimen stubs (6)
Range
  1. 2D array standards (3)
  2. Adhesives (1)
  3. Critical dimension (2)
  4. Light element support grids (1)
  5. Reference standards (5)
  6. Resolution standards - certified (1)
  7. SEM specimen stubs (6)
  8. Staining accessories (1)
Material
  1. Aluminium (6)
  2. Beryllium (1)
  3. Copper (3)
  4. Diamond (1)
  5. Molybdenum (2)
Style
  1. Low profile pin stubs (6)

Quick Buy
Order Code / Sku Qty

Load a list of SKUs

Add Row

PRICES: All prices shown on this web site are UK based prices only. Please contact your local agent or distributor who will be pleased quote for your local country.

Sign up now for exclusive offersarrow

  • Contact Us
  • Email us
  • Tel: +44 (0)1279 215 506
  • 08:30-17:00 GMT Mon - Fri
  • Agar Scientific Ltd
    Unit 7, M11 Business Link, Parsonage Lane,
    Stansted, Essex CM24 8GF UK
visa mastercard sagepay
Twitter LinkedIn

© 2017 Agar Scientific Ltd. All Rights Reserved. magento e-commerce by Screen Pages

100% secure online purchasing