FIB
6 Item(s)
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SEM Specimen Stubs, 12.7mm dia, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
6 Item(s)
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