Probes

HQ (High Quality AFM probe technology) is the next generation of probe distinguished by its high quality and high repeatability of characteristics. The probes have consistent reflectivity of uncoated cantilevers, tip radius and quality factor. The HQ probe chips have corners that allow them to be used at an angle from the vertical.

• Radius of curvature. The radius of curvature measures the sharpness of a particular probe. Typically, the sharper the curvature radius the more fragile a silicon tip is. Conversely, a larger curvature radius provides greater durability, but reduces the benefits of a sharper tip. Achieving a consistent balance delivers reliable and accurate results. 94% of HQ probes have a radius of curvature between 7 and 10nm.
• Tip shape factor. A higher value indicates a higher aspect ratio probe. A tighter range of values indicates a more consistent tip shape. Results of the tip shape factor tests show consistent and close grouping of data. Known tip shape insures accuracy of results. 92% of HQ probes have an aspect ratio between 1.4 and 1.8.
• Resonance frequency. Probes are designed to maintain a tight range of resonance frequencies. Reliability in cantilever specifications ensures dependable measurement results.