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Agar Scientific

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Probes - Conductive (SPARK range)

Probes - Conductive (SPARK range)

High quality conductive AFM probes with a platinum coating for nanoscale electrical characterisation. These are manufactured to the tightest dimensional tolerances in the market, offering minimal variation in spring constant and resonant frequency.
Applications of these probes - Electrical AFM measurements including conductive atomic force microscopy (CAFM), piezo-response microscopy (PFM), electrostatic force microscopy (EFM), scanning kelvin probe microscopy (SKPM), scanning impedance microscopy (SIM) etc.

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2 Item(s)

  1. Spark 70 - cantilever

    SPARK 70 Pt - AC mode silicon AFM probes with Pt conductive coating on both sides

    More Information

    !NEW!

    Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).

    Part no: AGT705

  2. Spark 350 Anchor

    SPARK 350 Pt - AC mode silicon AFM probes with Pt conductive coating on both sides

    More Information

    !NEW!

    Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).

    Part no: AGT704

Set Descending Direction

2 Item(s)