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292nm pitch resolution reference standards for AFM

292nm pitch resolution reference standards for AFM

292nm pitch reference standard for very high resolution calibration of AFM.

All prices exclude VAT.

Description

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF7055 292nm AFM Reference Standard on 12mm Disc Loading...	Loading...	POA	POA
AGF7055T 292nm Traceable AFM Reference Standard 12mm Disc Loading...	Loading...	POA	POA

Product Description

The 292nm pitch is accurate to ±1%. The surface structure is titanium lines on silicon. The line height is approximately 30nm with a line width of 130nm (not calibrated).

For AFM it can be used in contact, tapping, and other modes, with image sizes from 500nm to 20µm.

It can be supplied either non-certified, or with a non-traceable manufacturer’s certificate stating average pitch based on batch measurements.

Delivery & Returns

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.