Calibration standards
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MetroChip calibration standard
More InformationThe MetroChip microscope calibration standard provides an extensive range of features for SEM, FIB, AFM, light microscopy and metrology systems calibration.Part no: AGS1949
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Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um structure
More InformationThis CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch. -
Critical dimension (CD) calibration test specimens - 500-200-100 nm structure
More InformationThis advanced CD calibration test specimen is suitable for calibrating smaller structures.




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