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AFM & SPM

International suppliers of consumables for AFM and SPM including; Calibration standards, Diamond knives, Specimen preparation, Specimen storage and Substrates

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  1. Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5µm structure

    Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um structure

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    This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.
  2. Critical dimension (CD) calibration test specimens - 500-200-100 nm structure

    Critical dimension (CD) calibration test specimens - 500-200-100 nm structure

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    This advanced CD calibration test specimen is suitable for calibrating smaller structures.
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AFM & SPM

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  1. Calibration standards (2)

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    Unit 7, M11 Business Link, Parsonage Lane,
    Stansted, Essex CM24 8GF UK
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