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AFM & SPM

International suppliers of consumables for AFM and SPM including; Calibration standards, Diamond knives, Specimen preparation, Specimen storage and Substrates

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6 Item(s)

  1. SEM image of the regular silicon tip

    Pyramidal silicon etched AFM probes

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    Non-contact, Contact and 4-Lever silicon probes.
  2. SEM image of the conducting silicon tip

    Conductive Pyramidal silicon AFM etched probes

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    Conductive Non-contact, Contact and 4-Lever silicon probes.
  3. SEM image of a tipless silicon cantilever

    Tipless AFM probes

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    Tipless Non-contact and Contact, three lever silicon probes.
  4. SEM image of the Hard tip

    Hardened DLC coated silicon probes

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    Long scanning hardened silicon probes.
  5. SEM image of the magnetic silicon tip

    Magnetic Non-contact silicon probes

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    Co-Cr coated magnetic silicon probes.
  6. SEM image of the High Resolution spike

    High Resolution silicon probes

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    High Resolution silicon probes.
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6 Item(s)

AFM & SPM

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  • 08:30-17:00 GMT Mon - Fri
  • Agar Scientific Ltd
    Unit 7, M11 Business Link, Parsonage Lane,
    Stansted, Essex CM24 8GF UK
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