AFM & SPM

International suppliers of consumables for AFM and SPM including; Calibration standards, Diamond knives, Specimen preparation, Specimen storage and Substrates

Geller reference standards MRS-3
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The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation including scanning, optical reflection and transmission, scanning probe and confocal microscopy.
Geller reference standards MRS-4
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For high magnification calibration, two additional nested squares with pitches of 1 and 0.5µm extend the useful calibration range to x200,000.
Geller reference standards MRS-6
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A fifth generation, NIST and NPL Traceable, Magnification Reference Standard & Stage Micrometer. For Instrument Calibration from 1,500X – 1,000,000X (80nm min. pitch).
145nm AFM Reference Standard for AFM
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The 145nm pitch is accurate to ±1nm.
292nm pitch resolution reference standards for AFM
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292nm pitch reference standard for very high resolution calibration of AFM.
2-D holographic array standards
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2-D holographic array standards for simultaneous calibration of X and Y axes.
Highly ordered pyrolytic graphite (HOPG)
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HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopy.
Gold calibration kit
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Gold colloids of known size provide a reliable means of characterising tip geometry and calibrating the Z-axis to piezoelectric response.
Calibration gratings - TGXYZ series
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Calibration gratings arrays of different structures comprising rectangular silicon dioxide steps on a silicon wafer.
Grating type TGX
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The TGX series silicon calibration grating is an array of square holes with sharp undercut edges formed by the (110) crystallographic planes of silicon. The typical radius of the edges is less than 5 nm
Calibration grating sets TGS
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Sets of calibration gratings and test structures are available to suit different requirements.
Calibration gratings
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The calibration gratings feature one-dimensional arrays of trapezoidal steps etched into a silicon substrate.