£ GBP

Agar Scientific

Microscopy and Lab
supplies at your fingertips

AFM & SPM

International suppliers of consumables for AFM and SPM including; Calibration standards, Diamond knives, Specimen preparation, Specimen storage and Substrates

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Items 1-12 of 70

  1. Agar storage boxes for metal AFM/SPM discs

    Agar storage boxes for metal AFM/SPM discs

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    These 75 x 120 x 32mm storage boxes are available with magnetic strips to hold metal SPM discs.
  2. Scout 70 cantilever

    SCOUT 70 - AC mode silicon AFM probes

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    !NEW!

    High quality silicon AFM probes suitable for non-contact/soft tapping, force modulation modes in air and on softer samples. Available uncoated or with an aluminium or gold reflective backside coating.

  3. Spark 70 - cantilever

    SPARK 70 Pt - AC mode silicon AFM probes with Pt conductive coating on both sides

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    !NEW!

    Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).

    Part no: AGT705

  4. AFM cantilever, no coating 300kHz 26N/m

    AFM cantilever, no coating 300kHz 26N/m

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    !NEW!

    Standard tapping mode AFM cantilever without coating. Topography measurement.

  5. Silicon piezo-resistive self-sensing cantilever

    Silicon piezo-resistive self-sensing cantilever

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    Self-Sensing Cantilever for non-contact and contact mode applications. Resonant frequency range 500-1300kHz. Spring constant range 35-400N/m.
  6. AFM/STM Metal Specimen Discs
  7. AFM Mica Discs

    AFM Mica Discs

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    Available in four different diameters.
  8. SEM image of the regular silicon tip

    Pyramidal silicon etched AFM probes

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    Non-contact, Contact and 4-Lever silicon probes.

  9. DiATOME AFM preparation - Diamond Knives

    DiATOME AFM preparation - Diamond Knives

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    These knives have been designed for surface sectioning of biological and industrial specimens for atomic force microscopy.
  10. DiATOME Cryo AFM - Diamond Knives

    DiATOME Cryo AFM - Diamond Knives

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    This knife has been designed for surface sectioning of biological and industrial specimens for atomic force microscopy, producing extremely smooth sample surfaces, and offering the best possible structure preservation.
  11. Scout 350 anchor

    SCOUT 350 - AC mode silicon AFM probes

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    !NEW!

    High quality silicon AFM probes suitable for hard samples and stable, softer samples. Available uncoated or with an aluminium or gold reflective backside coating.

  12. Spark 350 Anchor

    SPARK 350 Pt - AC mode silicon AFM probes with Pt conductive coating on both sides

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    !NEW!

    Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).

    Part no: AGT704

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Items 1-12 of 70