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Agar Scientific

Microscopy and Lab
supplies at your fingertips

AFM & SPM

International suppliers of consumables for AFM and SPM including; Calibration standards, Diamond knives, Specimen preparation, Specimen storage and Substrates

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Items 1-12 of 67

  1. Silicon AFM Probes manufactured to tightest dimensional tolerances

    Silicon AFM Probes

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    !NEW!

    High quality silicon AFM probes manufactured to the tightest dimensional tolerances available offering minimal variation in spring constant and resonant frequency.

  2. AFM cantilever, no coating 300kHz 26N/m

    AFM cantilever, no coating 300kHz 26N/m

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    !NEW!

    Standard tapping mode AFM cantilever without coating. Topography measurement.

  3. Silicon piezo-resistive self-sensing cantilever

    Silicon piezo-resistive self-sensing cantilever

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    Self-Sensing Cantilever for non-contact and contact mode applications. Resonant frequency range 500-1300kHz. Spring constant range 35-400N/m.
  4. AFM/STM Metal Specimen Discs
  5. AFM Mica Discs

    AFM Mica Discs

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    Available in four different diameters.
  6. SEM image of the regular silicon tip

    Pyramidal silicon etched AFM probes

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    Non-contact, Contact and 4-Lever silicon probes.

  7. DiATOME AFM preparation - Diamond Knives

    DiATOME AFM preparation - Diamond Knives

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    These knives have been designed for surface sectioning of biological and industrial specimens for atomic force microscopy.
  8. DiATOME Cryo AFM - Diamond Knives

    DiATOME Cryo AFM - Diamond Knives

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    This knife has been designed for surface sectioning of biological and industrial specimens for atomic force microscopy, producing extremely smooth sample surfaces, and offering the best possible structure preservation.
  9. Agar storage boxes for metal AFM/SPM discs

    Agar storage boxes for metal AFM/SPM discs

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    These 75 x 120 x 32mm storage boxes are available with magnetic strips to hold metal SPM discs.
  10. SEM image of the conducting silicon tip

    Conductive Pyramidal silicon AFM etched probes

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    Conductive Non-contact, Contact and 4-Lever silicon probes.
  11. SEM image of a tipless silicon cantilever

    Tipless AFM probes

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    Tipless Non-contact and Contact, three lever silicon probes.
  12. SEM image of the Hard tip

    Hardened DLC coated silicon probes

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    Long scanning hardened silicon probes.
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Items 1-12 of 67